Welcome to ECAP II
I am very pleased to take this opportunity to welcome and congratulate the launching of the website on EC-ASEAN Intellectual Property Rights Cooperation Programme (ECAP II). On behalf of the Department of Intellectual Property, Standardization and Metrology of Lao People?s Democratic Republic (Lao PDR) I would like to express my sincere gratitude and appreciation to the European Commission and the implementing agencies namely the European Patent Office and the Office for the Harmonization in the Internal Market for their generous and active support in the field of intellectual property.
A welcome address by Nheune Sisavad, Director General, Department of Intellectual Property, Standardization and Metrology of Lao People?s Democratic Republic (Lao PDR)
In today?s competitive environment of free trade and globalization, the protection of intellectual property has become more and more important in the international arena. The emergence of a new global economy boosted by rapid technological advance and worldwide communication system has placed intellectual property in the mainstream of socio-economic development policy in many countries.
Recognizing the significant role that intellectual property system plays in the development of the country and the advantages that Lao PDR will benefit from the protection of intellectual property rights, we are committed to modernizing and strengthening our system in line with international trend in particular WTO?s Agreement on TRIPS.
It was of great benefit and interest when Lao PDR signed with European Commission the Financing Agreement in March 2003 to include Lao PDR in ECAP. The various activities under ECAP II provide opportunities for members to exchange experiences and to learn from our counterparts, particularly in the areas of effective protection and use of intellectual property rights.
I look forward to fruitful cooperation with European Commission under the ECAP II Programme.
Mr. Nheune Sisavad
Department of Intellectual Property
Standardization and Metrology